Description

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This book compiles various research papers written by experts and scientists. It is a comprehensive summary of the various features of Transmission Electron Microscopy (TEM), from fundamental mechanisms and diagnosis to the recent developments in this area. This book discusses electron microscopy, new techniques for projection of images, experimental techniques for the study of nanomaterials, among others. The book also elucidates theoretical and practical aspects of modern microscopy techniques and the usage of TEM in material characterization. It will be beneficial for students, scientists, engineers and researchers working in this field.