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Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics) (Paperback)

Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics) Cover Image
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Description


The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

Product Details
ISBN: 9781681740560
ISBN-10: 1681740567
Publisher: Morgan & Claypool
Publication Date: October 12th, 2015
Pages: 68
Language: English
Series: Iop Concise Physics

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